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Muestras EDXRF
EDXRF Analyzers

X-ray fluorescence technology provides one of the simplest, most accurate and most economic analytical methods for the determination of the elemental composition of most types of materials. The technique is generally non-destructive, requiring little if any sample preparation, and is suitable for solids, liquids, powders and alloys. XRF can measure a wide range of elements, from beryllium (5) to uranium (92), while providing sub-ppm detection limits for many applications.

 

NEX QC
Analizador NEX QC

• Non-destructively analysis

• Solids, liquids, powders and thin films

• Modern smartphone style user interface

• Convenient built in thermal printer

• Unmatched performance-to-price ratio

 

NEX QC+
NEX QC+

• Non-destructively analysis

• Solids, liquids, powders and thin films

• Modern smartphone style user interface

• Convenient built in thermal printer

• SDD detector

NEX CG
Analizador NEX CG

• Non-destructively analysis

• Solids, liquids, powders and thin films

• Polarized excitation for lower detection limits

• Novel treatment of peak overlap reduces errors

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